The goal of the postdoc is to develop hard x-ray grating interferometery at the Advanced Photons Source and application to key scientific and technical areas including wavefront sensing, metrology and quantitative high speed imaging and tomography. The work involves designing, building and testing the interferometer in close collaboration with members of diverse groups including x-ray optics and detector and x-ray imaging group at the APS X-ray Science Division, and the micro- and nanofabrication group at the Center for the Nanoscale Materials (CNM). The candidate will be responsible for developing data acquisition and analysis software and conduct extensive beamline testing and characterization on prototype devices, enhance desirable operational characteristics, and improve the performance beyond existing systems. Successful results may significantly advance key APS scientific research requiring quantitative real time wavefront sensing, high sensitive differential phase contrast imaging and high speed tomography, in hard x-ray regime.
Knowledge, Skills and ExperienceConsiderable
Interest in experimental work. The ability to work independently and to innovate. Ability to drive individual projects to success and the desire to work in a challenging professional atmosphere. Ability to work well in a diverse and multi-disciplinary global team.Good
Programming (IDL, Matlab, C++, Python) and oral and written communication skills.Other
The candidate should hold a Ph.D. in physics, applied physics, electrical engineering, applied mathematics, or related field. Experience with at least one or several of the followings: interferometry, optomechanical design, wavefront sensing and metrology, and phase contrast imaging. Experience with synchrotron imaging and image processing.Minimum Education/Experience Requirements
Years Since Ph.D. — 0-1, 1-2, 2-3
- To apply:
- Visit http://www.anl.gov/jobsearch/detail.jsp?userreqid=317012+XSD&lsBrowse=POSTDOC