Nanotechnology : B2B Imaging and microscopy products

AFM Nanoprober

susie-mauceri — Mon, 02 Jun 2008 16:31:03 +0100

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MultiProbe’s 1-to-6 head Atomic Force nanoprobing tool is used in failure analysis and combines multi-scan fault isolation imaging with nanoprobing electrical capabilities. For process technology node measurements of 32nm, 45nm, 65nm, 90nm or larger.

Product company name

MultiProbe

Product company Url

www.multiprobe.com

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AR5-NCHR AFM tip

Benj — Tue, 17 Oct 2006 14:33:18 +0100

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- length of the high aspect ratio portion of the tip > 2 µm
- typical aspect ratio at 2 µm in the order of 7:1 (when viewed from side as well as along cantilever axis)
- (when viewed from side as well as along cantilever axis !)
- half cone angle at 2 µm of the high aspect ratio portion typically < 5°
- guaranteed tip radius of curvature < 15 nm
- highly doped to dissipate static charge
- high mechanical Q-factor for high sensitivity

The reflex coating is 30 nm thick aluminum coating on the detector side of the cantilever which enhances the reflectivity of the laser beam by a factor of about 2.5. Furthermore it prevents light from interfering within the cantilever. The virtually stress-free coating is bending the cantilever less than 2 % of the cantilever length.

Product company name

Nanosensors

Product company Url

http://www.nanosensors.com/

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CTR-1 Raman microspectrometer

pwawl321 — Sat, 29 Mar 2008 02:40:21 +0000

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CRAIC Technologies offers the CTR-1 Raman microspectrometer for fast, easy and accurate Raman microspectroscopy. Capable of acquiring Raman spectra of microscopic samples, the system can be configured with one of three wavelength lasers: 546, 685 or 785 nm. A robust and durable unit, the CTR-1 is backed by CRAIC Technologies expert technical support.

Product company name

CRAIC Technologies, Inc.

Product company Url

www.microspectra.com

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Fei's Titan 80-300 kV S/TEM powerful microscope

Benj — Thu, 19 Oct 2006 15:29:26 +0100

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The stability, performance and ease-of-use of Titan enables corrected microscopy to be taken to the next level where new discoveries on the structure-property relationships of materials become possible at ever-decreasing scales. Titan is poised to bring electron microscopy
into a new era by expanding the boundaries and achieving new results in nanoresearch.

Product company name

FEI Company

Product company Url

http://www.fei.com/

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MFP-3D (tm) Stand alone Atomic Force Microscope ( AFM )

Benj — Wed, 13 Dec 2006 14:14:49 +0000

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Sensored optical lever with diffraction limited optics and a low coherence light source virtually eliminates interference artifacts. The NPS™ sensored Z axis provides precise measurements of the cantilever position for accurate force and topography measurements. An optional Extended Head allows for a 28µm Z range.

Product company name

Asylum Research

Product company Url

http://www.asylumresearch.com/

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NANOSIGHT LM10™ Particle Analysis System

Benj — Tue, 24 Oct 2006 16:29:17 +0100

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NANOSIGHT™ provides a new view of the nano-world. Aside from particle size analysis, this device can be used to study nanofluidics, deposition, gel formation, agglomeration and a range of other events in real time.

The system is proven on most classes of nano-particle (below), down to 15nm (dependent upon particle type), in a wide range of solvents:

* Most hard nano-particles
* Virus samples
* Pigments in inks and paints
* Single DNA molecules
* Metal oxides in magnetic storage media
* Precursor chemicals and CMP slurry for wafer fabrication
* Multi-walled Carbon nanotubes
* Fuel additives
* Cosmetics and personal care products
* Foodstuffs
* Ceramics
* Ferritin molecules
* Polymers, emulsions and colloids

Product company name

NanoSight Limited

Product company Url

http://www.nanosight.co.uk/

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Q30K-Plus scanning proximity probe

Benj — Thu, 28 Sep 2006 21:47:42 +0100

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In addition to the enhanced Q-factor and the optimized signal to noise ratio the Q30K-Plus series offers all features of the PointProbe® plus series like a minimized variation in tip shape and a typical tip radius of less than 7nm.

The first product of the new Q30K-Plus line will be commercially available starting January 2006 in the following versions: PPP-QFMR and PPP-QNCHR. Other types for different operation modes and different tip shapes are being developed.

Product company name

Nanosensors

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QDI 2010 UV-visible-NIR Microspectrophotometer

pwawl321 — Sat, 29 Mar 2008 02:23:02 +0000

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CRAIC Technologies manufactures the QDI 2010™ microspectrophotometer for spectral analysis and imaging of microscopic samples. Operating in the ultraviolet, visible and NIR regions, this unit can be configured for transmittance, reflectance, fluorescence and even polarization microspectroscopy and micro-imaging of samples smaller than a micron. Many options are available including NIST traceable standards, automation and a host of specialized software packages including QDI FilmPro™ for thin film thickness measurements.

Product company name

CRAIC Technologies, Inc.

Product company Url

www.microspectra.com

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QDI 302 Microscope Spectrophotometer

pwawl321 — Sat, 29 Mar 2008 02:30:18 +0000

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CRAIC Technologies manufactures the QDI 302™ spectrophotometer for your microscope. Incorporating both spectral analysis and imaging of even sub-micron sized samples, the spectrophotometer is only limited by the microscope optics. Operating in the ultraviolet, visible and NIR regions, the QDI 302™ can be configured for transmittance, reflectance, fluorescence and even polarization microspectroscopy and micro-imaging. Many options are available including NIST traceable standards, automation and a host of specialized software packages including QDI FilmPro™ for thin film thickness measurements.

Product company name

CRAIC Technologies, Inc.

Product company Url

www.microspectra.com

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The Nanosurf (r) Nanite Automated Atomic Force Microscope

Benj — Thu, 16 Nov 2006 17:08:40 +0000

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The Nanosurf Nanite extends Nanosurf's new and innovative AFM scanner design to work-intensive industrial applications. When time and throughput are of utmost importance, the automated Nanite system is your answer.

Ease of use:

The Nanite continues the Nanosurf tradition of ease of use, in both the hardware setup and software control. Like other Nanosurf AFMs, the Nanite's optics are pre-aligned - completely eliminating the need to manually align the laser and detector. The intuitive user interface features three pre-set skill levels and seamless integration of the video optics.

Automation:

The Nanite's programming interface allows you to image your samples automatically, whether your process requires measurements on random or pre-defined locations on a large surface or on multiple samples!

* move the AFM to pre-defined locations on a single sample
* move the AFM from one sample to another
* automatically withdraw before moving to a new location and auto-engage before each new image acquisition
* perform predefined measurements with any scan size, setpoint or any other parameter normally controlled manually
* auto-generate a report with image and statistical analysis for each data set acquired

Product company name

Nanoscience Instruments, Inc.

Product company Url

http://www.nanoscience.com/

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UVM-1 UV-visible-NIR range microscope

pwawl321 — Sat, 29 Mar 2008 02:36:34 +0000

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CRAIC Technologies manufactures the UVM-1™, a unique microscope that is capable of high resolution digital imaging from the deep UV through the near infrared. This unit can be configured for transmittance, reflectance, fluorescence and even polarization imaging of sub-micron sized samples far beyond what the eye can see. The UVM-1™ can also be fitted with high resolution systems for imaging in the deep UV on into the NIR regions. Narrow or broad-band imaging can be done and can easily be changed. User friendly, yet sophisticated, imaging software is included with CRAIC imaging packages.

Product company name

CRAIC Technologies, Inc.

Product company Url

www.microspectra.com

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Zetasizer ® Nano Series

Fri, 10 Aug 2007 12:23:00 +0100

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The new technology incorporated in these systems provides unequalled sensitivity and versatility. The patented NIBS optics incorporated into the Nano Z ™ and Nano ZS ™ also allows measurements of samples with little or no dilution.

Particle size - NIBS technology enables measurements of particles and molecules from 0.6nm to 6 microns.
Zeta potential - M3-PALS technology enables accurate measurements of zeta potential in aqueous and non-aqueous dispersions.
Molecular weight - An avalanche-photodiode detector and fibre detection optics give the sensitivity and stability required for absolute molecular weight measurement.

The Zetasizer ® Nano ZS ™ is the pinnacle of the Malvern ® Zetasizer ® Nano series and can measure all three parameters with no performance compromises.

The Nano ZS ™, Z ™ and ZS90 ™ can all use the unique disposable zeta potential cell to ensure no cross contamination of samples. All systems are compatible with the MPT-2 autotitrator to enable trend measurements and sample preparation to be automated..

Nanotechnology : B2B Imaging and microscopy products

AFM Nanoprober

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AR5-NCHR AFM tip

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CTR-1 Raman microspectrometer

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Fei's Titan 80-300 kV S/TEM powerful microscope

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MFP-3D (tm) Stand alone Atomic Force Microscope ( AFM )

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NANOSIGHT LM10™ Particle Analysis System

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Q30K-Plus scanning proximity probe

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QDI 2010 UV-visible-NIR Microspectrophotometer

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