Scanimetrics is focused on wireless virtual probe technology to test semiconductor chips, resolving the issues and bottlenecks imposed on semiconductor manufacturers by current testing methods.

Our technology will have a profoundly positive impact on chip size; the smaller size of these products will be enabled by Scanimetrics’ chip scale communication, advanced packaging and System-in-Package (SiP) applications.

Scanimetrics, Inc., develops and markets a revolutionary non-contact virtual probe technology that helps enable Moore’s Law for nanoscale devices. Its first products are targeted at testing semiconductor chips and system-in-package (SiP) devices using micro-scale radio frequency techniques. Its WiTAP™ (Wireless Test Access Port) non-contact testing technology enables chip manufacturers to dramatically reduce testing costs, increase testing speed and reliability, and eliminate manufacturing defects caused by standard, physical contact-based testing. By supporting reduced chip sizes, Scanimetrics enables chipmakers and their customers to respond faster to market demands for ever-smaller computing, communications, medical, automotive and other electronic devices.

Based in Edmonton, Alberta, Scanimetrics works with some of the world’s largest chipmakers and equipment suppliers helping them stay on track with Moore’s Law. In October 2006, the company completed a second round of venture funding of CAN $6.5 million, enabling it to expand its market reach and accelerate product development.