Advanced Surface Microscopy, Inc. is an independent analytical/contract research laboratory. We are dedicated to providing outstanding analytical services, research and consulting to developers, producers and users of advanced materials and devices.

Our expertise:

All technical work is supervised by Dr. Donald A. Chernoff. Dr. Chernoff holds a Ph.D. in Physical Chemistry (University of Chicago) and has more than 12 years industrial research experience; he has been active in the field of scanning probe microscopy since its development in 1986. His significant contributions in the area of laser spectroscopy and optics, electron microscopy and the practical application of microscopy to process improvement have resulted in over 25 publications.